Resistivity studies on different variants of κ-(BEDT-TTF) 2Cu[N(CN) 2]Br: Evidence for disorder and/or defect-induced inelastic scattering contributions

Journal of Low Temperature Physics

Volumn 142, Issue 3-4, 2006, Pages 191-197

  Lang, M ^a   Strack, Ch ^a   Akinci, C ^a   Wolf, B ^a   Schlueter, J A ^b   Wosnitza, J ^c   Schweitzer, D ^d   Schreuer, J ^a   Wiehl, L ^a  

^a GOETHE UNIVERSITY   (Germany)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-RESOLUTION X-RAY; MOLECULAR CONDUCTORS;

DEFECT STRUCTURES; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON PROBE MICROANALYSIS; HYDROSTATIC PRESSURE; INELASTIC SCATTERING; LOW TEMPERATURE EFFECTS;

SINGLE CRYSTALS;

EID: 34447627166     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/s10909-006-9018-x     Document Type: Conference Paper

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