Scanning electron microscopic analysis of diode laser-treated titanium implant surfaces

Photomedicine and Laser Surgery

Volumn 25, Issue 2, 2007, Pages 124-128

  Castro, Gonzalo López ^a   Gallas, Mercedes ^a   Núñez, Ignacio Rodríguez ^a   Borrajo, José Luis Leyes ^a   Álvarez, Juan Cuevas ^a   Varela, Luis García ^a  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIODE LASER-TREATED TITANIUM IMPLANT SURFACES; LASER-BASED PROTOCOLS; PERI-IMPLANTITIS;

LASER DIAGNOSTICS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SURFACE ANALYSIS; TITANIUM;

IMPLANTS (SURGICAL);

ARSENIC; GALLIUM; INDIUM; TITANIUM;

ARTICLE; CLINICAL EFFECTIVENESS; CONTROLLED STUDY; DIODE LASER; IMPLANT SURFACE DECONTAMINATION; MORPHOLOGY; PERIIMPLANTTITIS; PERIODONTICS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TECHNIQUE; TOOTH IMPLANTATION;

DENTAL IMPLANTS; HUMANS; LASERS; MATERIALS TESTING; MICROSCOPY, ELECTRON, SCANNING; TITANIUM;

EID: 34447517546     PISSN: 15495418     EISSN: None     Source Type: Journal    
DOI: 10.1089/pho.2006.1086     Document Type: Article

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