Near surface stress determination in Kr-implanted polycrystalline titanium by the X-ray sin2Ψ-method

Surface and Coatings Technology

Volumn 201, Issue 19-20 SPEC. ISS., 2007, Pages 8237-8241

  Harting M ^a   Nsengiyumva, S ^a,b   Raji, A T ^a   Dollinger, G ^c   Sperr, P ^c   Naidoo, S R ^d   Derry, T E ^d   Comrie, C M ^a   Britton, D T ^a  

^a UNIVERSITY OF CAPE TOWN   (South Africa)

^b UNIVERSITY OF RWANDA   (Rwanda)

^c BUNDESWEHR UNIVERSITY MUNICH   (Germany)

^d UNIVERSITY OF THE WITWATERSRAND   (South Africa)

Author keywords

Implantation damage; Krypton; Residual stress; Stress induced diffusion; Stress relaxation; Titanium

Indexed keywords

DEFECT CLUSTER; STRESS INDUCED DIFFUSION;

ION IMPLANTATION; KRYPTON; POLYCRYSTALS; RESIDUAL STRESSES; STRESS CONCENTRATION; STRESS RELAXATION; TENSILE STRESS;

TITANIUM;

ION IMPLANTATION; KRYPTON; POLYCRYSTALS; RESIDUAL STRESSES; STRESS CONCENTRATION; STRESS RELAXATION; TENSILE STRESS; TITANIUM;

EID: 34447503576     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2006.02.072     Document Type: Article

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