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34447336470
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This is ascribed to the presence of small amounts of radical impurities, perhaps produced as the result of facile one-electron reduction of the compound in solution. Consistent with this, a small <1, but detectable peak was seen in the ESR spectrum of 5
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This is ascribed to the presence of small amounts of radical impurities, perhaps produced as the result of facile one-electron reduction of the compound in solution. Consistent with this, a small (<1%) but detectable peak was seen in the ESR spectrum of 5.
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19
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0032547242
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Ito, O.7
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20
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34447339714
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The line width becomes significantly broader with increasing temperature
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The line width becomes significantly broader with increasing temperature.
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21
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0028524211
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V complexes, see: (a) Miyake, C.; Sano, Y. J. Alloys Compd. 1994, 213/214, 493-496.
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V complexes, see: (a) Miyake, C.; Sano, Y. J. Alloys Compd. 1994, 213/214, 493-496.
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22
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0037540058
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(b) Berthet, J.-C.; Nierlich, M.; Ephritikhine, M. Angew. Chem., Int. Ed. 2003, 42, 1952-1954.
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