Multi-resolution system for artifact removal and edge enhancement in computerized tomography images

Pattern Recognition Letters

Volumn 28, Issue 13, 2007, Pages 1769-1780

  Arivazhagan, S ^a   Deivalakshmi, S ^a   Kannan, K ^a   Gajbhiye, B N ^b   Muralidhar, C ^b   Lukose, Sijo N ^b   Subramanian, M P ^b  

^a MEPCO SCHLENK ENGINEERING COLLEGE   (India)

^b Defence Research Development Laboratory ^*  (India)

Author keywords

Edge enhancement; Industrial CT images; Multi resolution techniques

Indexed keywords

ARTIFACT REMOVAL; EDGE ENHANCEMENT; INDUSTRIAL CT IMAGES; MULTI-RESOLUTION SYSTEM;

COMPUTERIZED TOMOGRAPHY; IMAGE ANALYSIS; IMAGE ENHANCEMENT; OPTICAL RESOLVING POWER;

MULTIRESOLUTION ANALYSIS;

EID: 34447303296     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2007.05.003     Document Type: Article

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