AMS implications of charge-changing during acceleration

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 261, Issue 1-2 SPEC. ISS., 2007, Pages 582-587

  Knies, D L ^a   Grabowski, K S ^a   Cetina, C ^b   Demoranville, L T ^c   Dougherty, M R ^c   Mignerey, A C ^c   Taylor, C L ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b NOVA RESEARCH INC   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

Accelerator mass spectrometry; Charge state distribution; Molecular interference; Secondary ion mass spectrometry; Stripper yields; Trace elements; Transmission

Indexed keywords

ACCELERATOR MASS SPECTROMETRY; CHARGE STATE DISTRIBUTION; MOLECULAR INTERFERENCE; STRIPPER YIELDS;

ELECTRIC CHARGE; ION SOURCES; PARTICLE BEAMS; SECONDARY ION MASS SPECTROMETRY; TRACE ELEMENTS;

PARTICLE ACCELERATOR ACCESSORIES;

EID: 34447291888     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.115     Document Type: Article

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