Characterisation of phase relations and properties in air-oxidised Ti3SiC2

Materials Science and Engineering: A

Volumn 466, Issue 1-2, 2007, Pages 140-147

  Low, I M ^a   Wren, E ^a   Prince, K E ^b   Atanacio, A ^b  

^a CURTIN UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Depth profiling; Diffraction; Oxidation; SIMS; Ti3SiC2

Indexed keywords

CHARACTERIZATION; CRYSTALLIZATION; DEPTH PROFILING; INTERFACES (MATERIALS); MICROHARDNESS; OXIDATION; STRUCTURE (COMPOSITION);

MICROSCALE; NANOSCALE; PHASE DISTRIBUTION;

TITANIUM COMPOUNDS;

CHARACTERIZATION; CRYSTALLIZATION; DEPTH PROFILING; INTERFACES (MATERIALS); MICROHARDNESS; OXIDATION; STRUCTURE (COMPOSITION); TITANIUM COMPOUNDS;

EID: 34447268500     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2007.02.034     Document Type: Article

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