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Volumn 57, Issue 6, 2007, Pages 513-516

Abnormal polarity effect of electromigration on intermetallic compound formation in Sn-9Zn solder interconnect

Author keywords

Abnormal polarity effect; Electromigration; Intermetallic compound

Indexed keywords

POLARITY EFFECTS; SOLDER INTERCONNECTS;

EID: 34447262124     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2007.05.023     Document Type: Article
Times cited : (64)

References (16)
  • 6
    • 2442600262 scopus 로고    scopus 로고
    • K.L. Lin, Y.H. Fang, in: Proceedings of the 9th International Symposium on Advanced Packaging Materials, Atlanta, GA, 2004, 17.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.