First critical steps for understanding complex advanced materials: Synergy between X-ray diffraction and electron microscopy

Comptes Rendus Chimie

Volumn 10, Issue 7, 2007, Pages 604-612

  Hervieu, Maryvonne ^a   Michel, Claude ^a  

^a LABORATOIRE CRISMAT   (France)

Author keywords

Research of new materials; Transmission electron microscopy; X ray diffraction techniques

Indexed keywords

EID: 34447260943     PISSN: 16310748     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crci.2007.01.011     Document Type: Short Survey

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