Utilization of actively-induced, prompt radiation emission for nonproliferation applications

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 261, Issue 1-2 SPEC. ISS., 2007, Pages 341-346

  Blackburn, B W ^a   Jones, J L ^a   Moss, C E ^b   Mihalczo, J T ^c   Hunt, A W ^d   Harmon, F ^d   Watson, S M ^a   Johnson, J T ^a  

^a IDAHO NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d IDAHO STATE UNIVERSITY   (United States)

Author keywords

Active interrogation; Nonproliferation; Photonuclear; Prompt emissions

Indexed keywords

ACCELERATOR PULSES; NONPROLIFERATION APPLICATIONS; NUCLEAR MATERIAL; PULSED PHOTONUCLEAR ASSESSMENT (PPA);

ELECTRON EMISSION; GAMMA RAYS; NEUTRONS; PARTICLE ACCELERATORS; PHOTONS; SIGNAL PROCESSING;

RADIATION EFFECTS;

EID: 34447250114     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.272     Document Type: Article

References (8)

1. J.L. Jones, et al., INEEL Formal Report, WINCO-1147, September 1993.
2. J.L. Jones, et al., INL Formal Report, WINCO-1225, October 1994.
3. J.L. Jones, et al., INL Formal Report, INEEL 02-01406, December 2002.
4. J.L. Jones, Active, non-intrusive inspection technologies, in: Sixth International Meeting on Nuclear Applications of Accelerator Technology (AccApp'03), ANS Conference Publication, 1-5 June 2003, p. 33.
5. J.L. Jones, et al., Photonuclear-based, nuclear material detection system for Cargo containers, in: 8th International Conference on the Application of Accelerators in Research and Industry, Fort Worth, Texas, 11-15 October 2004.
6. J.L. Jones, INL Report INL/EXT-05-01020, December 2005.
7. J.T. Mihalczo, ORNL Report ORNL/TM-2004/302, December 2004.
8. F. Ruddy, J. Seidel, R. Flammang, B. Petrovic, A. Dulloo, T. Congedo, Pulsed neutron interrogation for detection of concealed special nuclear materials, in: Proceedings of the SPIE Vol. 6213, 62130D, Non-Intrusive Inspection Technologies, May 2006.