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Volumn 28, Issue 7, 2007, Pages

Use of statistical parametric mapping (SPM) to enhance electrical impedance tomography (EIT) image sets

Author keywords

EIT; Image quality; SPM

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; FINITE ELEMENT METHOD; IMAGE ANALYSIS; IMAGE QUALITY; MAPPING; NEUROIMAGING; OPTICAL TRANSFER FUNCTION; QUALITY CONTROL; SIGNAL TO NOISE RATIO;

EID: 34447108195     PISSN: 09673334     EISSN: 13616579     Source Type: Journal    
DOI: 10.1088/0967-3334/28/7/S11     Document Type: Conference Paper
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.