Epitaxial growth and structural characterization of single crystalline ZnGeN2

MRS Internet Journal of Nitride Semiconductor Research

Volumn 4, Issue SUPPL. 1, 1999, Pages

  Zhu, L D ^a   Maruska, P H ^a   Norris, P E ^a   Yip, P W ^b   Bouthillette, L O ^b  

^a NZ Applied Technologies   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; EPITAXIAL GROWTH; GERMANIUM; LATTICE CONSTANTS; SEMICONDUCTOR LASERS; SINGLE CRYSTALS;

PHOTONIC DEVICES; PSEUDOMORPHIC GROUPS; STRUCTURAL CHARACTERIZATION; WURTZITE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 3442884350     PISSN: 10925783     EISSN: None     Source Type: Journal    
DOI: 10.1557/s1092578300002374     Document Type: Conference Paper

References (7)

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