Using image analysis for automated crystal positioning in a synchrotron X-ray beam for high-throughput macromolecular crystallography

Journal of Applied Crystallography

Volumn 37, Issue 2, 2004, Pages 265-269

  Andrey, Philippe ^a   Lavault, Bernard ^b   Cipriani, Florent ^b   Maurin, Yves ^a  

^a CEMAGREF   (France)

^b INSTITUT LAUE LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; AUTOMATION; CRYSTAL STRUCTURE; IMAGE ANALYSIS; MACROMOLECULE; MOLECULAR SIZE; STRUCTURE ANALYSIS; SYNCHROTRON RADIATION; X RAY ANALYSIS; X RAY CRYSTALLOGRAPHY;

EID: 3442877540     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188980400158X     Document Type: Article

References (8)

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