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Volumn 512, Issue , 2006, Pages 129-136
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Tailored electrochemical surface modification of semiconductors
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Author keywords
AFM; FIB; Self organization; Semiconductor; Surface patterning
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Indexed keywords
AMORPHIZATION;
ATOMIC FORCE MICROSCOPY;
DISSOLUTION;
ELECTRODEPOSITION;
FOCUSED ION BEAMS;
SURFACE TREATMENT;
ELECTROCHEMICAL DEPOSITION;
SELF ORGANIZATION;
SURFACE PATTERNING;
SEMICONDUCTOR MATERIALS;
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EID: 34347353587
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/0-87849-996-2.129 Document Type: Conference Paper |
Times cited : (3)
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References (29)
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