Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers

Journal of Physical Chemistry C

Volumn 111, Issue 23, 2007, Pages 8142-8144

  Zhang, Hua ^a   Müllen, Klaus ^b   De Feyter, Steven ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; AROMATIC POLYMERS; ATOMIC FORCE MICROSCOPY; CARBOXYLIC ACIDS; CHEMICAL MODIFICATION; FUNCTIONAL GROUPS; SELF ASSEMBLED MONOLAYERS;

ADHESION FORCE; ADHESIVE INTERACTIONS; CHEMICAL SPATIAL RESOLUTION; POLYPHENYLENE;

DENDRIMERS;

EID: 34347352026     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp073388u     Document Type: Article

References (32)

1. Binnig, G.; Quate, C. F.; Gerber, Ch. Phys. Rev. Lett. 1986, 56, 930.
2. (a) Newkome, G. R.; Moorefield, C. N.; Vögtle, F. Dendritic Molecules: Concepts, Synthesis, Perspectives; VCH: Weinheim, Germany, 1996.
3. (b) Zeng, F.; Zimmerman, S. C. Chem. Rev. 1997, 97, 1681.
4. (c) Frechet, J. M. J. Science 1994, 263, 1710.
5. (a) Hellmann, J.; Hamano, M.; Karthaus, O.; Ijiro, K.; Shimomura, M.; Irie, M. Jpn. J. Appl. Phys. 1998, 37, L816.
6. (b) Sheiko, S. S.; Eckert, G.; Ignat'eva, G.; Muzafarov, A. M.; Spickermann, J.; Räder, H. J.; Möller, M. Macromol. Rapid Commun. 1996, 17, 283.
7. (c) Huck, W. T. S.; van Veggel, F. C. J. M.; Sheiko, S. S.; Möller, M.; Reinhoudt, D. N. J. Phys. Org. Chem. 1998, 11, 540.
8. (a) Stocker, W.; Karakaya, B.; Schürmann, B. L.; Rabe, J. P.; Schlüter, A. D. J. Am. Chem. Soc. 1998, 120, 7691.
9. (b) Liu, D. J.; Zhang, H.; Grim, P. C. M.; De Feyter, S.; Wiesler, U. M.; Berresheim, A. J.; Müllen, K.; De Schryver, F. C. Langmuir 2002, 18, 2385.
10. (a) Bliznyuk, V. N.; Rinderspacher, F.; Tsukruk, V. V. Polymer 1998, 39, 5249.
11. (b) Tsukruk, V. V.; Rinderspacher, F.; Bliznyuk, V. N. Langmuir 1997, 13, 2171.
12. McKendry, R.; Huck, W. T. S.; Weeks, B.; Florini, M.; Abell, C.; Rayment, T. Nano Lett. 2002, 2, 713.
13. Zhang, H.; Elghanian, R.; Amro, N. A.; Disawal, S.; Eby, R. Nano Lett. 2004, 4, 1649.
14. Iyer, J.; Hammond, P. T. Langmuir 1999, 15, 1299.
15. Frisbie, C. D.; Rozsnyai, L. F.; Noy, A.; Wrighton, M. S.; Lieber, C. M. Science. 1994, 265, 2071.
16. (a) Noy, A.; Frisbie, C. D.; Rozsnyai, L. F.; Wrighton, M. S.; Lieber, C. M. J. Am. Chem. Soc. 1995, 117, 7943.
17. (b) Vezenov, D. V.; Noy, A.; Rozsnyai, L. F.; Lieber, C. M.; J. Am. Chem. Soc. 1997, 119, 2006.
18. (c) Zhang, H.; He, H. X.; Wang, J.; Liu, Z. F. Langmuir 2000, 16, 4554.
19. Rosa-Zeiser, A.; Weilandt, E.; Weilartdt, H.; Marti, O. Meas. Sci. Technol. 1997, 8, 1333.
20. Okabe, Y.; Furugori, M.; Tani, Y.; Akiba, U.; Fujihira, M. Ultramicroscopy 2000, 82, 203.
21. (a) Papastavrou, G.; Akari, S. Nanotechnology 1999, 10, 453.
22. (b) van der Vegte, E. W.; Subbotin, A.; Hadziioannou, G.; Ashton, P. R.; Preece, J. A. Langmuir 2000, 16, 3249.
23. Zhang, H.; Grim, P. C. M.; Vosch, T.; Wiesler, U.-M.; Berresheim, A. J.; Müllen, K.; De Schryver, F. C. Langmuir 2000, 16, 9294.
24. (a) Kwak, K. J.; Kudo, H.; Fujihira, M. Ultramicroscopy 2003, 97, 249.
25. (b) Kwak, K. J.; Sato, F.; Kudo, H.; Yoda, S.; Fujihira, M. Ultramicroscopy 2004, 100, 179.
26. (c) Schneider, M.; Zhu, M.; Papastavrou, G.; Akari, S.; Möhwald, H. Langmuir 2002, 18, 602.
27. (a) Zhang, H.; Grim, P. C. M.; Foubert, P.; Vosch, T.; Vanoppen, P.; Wiesler, U.-M.; Berresheim, A. J.; Müllen, K.; De Schryver, F. C. Langmuir 2000, 76, 9009.
28. (b) Zhang, H.; Grim, P. C. M.; Liu, D. J.; Vosch, T.; De Feyter, S.; .Wiesler, U. W.; Berresheim, A. J.; Müllen, K.; Van Haesendonck, C.; Vandamme, N.; De Schryver, F. C. Langmuir 2002, 18, 1801.
29. (a) He, H. X.; Zhang, H.; Li, Q. G.; Zhu, T.; Li, S. F. Y.; Liu, Z. F. Langmuir 2000, 16, 3846.
30. (b) Zhang, H.; He, H. X.; Wang J.; Mu, T.; Liu, Z. F. Appl. Phys. A 1998, 66, S269.
31. (c) Zhang, H.; He, H. X.; Mu, T.; Liu, Z. F. Thin Solid Films 1998, 327, 778.
32. (d) He, H. X.; Huang, W.; Zhang, H.; Li, Q. G.; Li, S. F. Y.; Liu, Z. F. Langmuir 2000, 76, 517.