A combinatorial thin film sputtering approach for synthesizing and characterizing ternary ZrCuAl metallic glasses

Intermetallics

Volumn 15, Issue 9, 2007, Pages 1208-1216

  Deng, Y P ^a   Guan, Y F ^a   Fowlkes, J D ^a   Wen, S Q ^a   Liu, F X ^a   Pharr, G M ^a   Liaw, P K ^a   Liu, C T ^a   Rack, P D ^a  

^a University of Tennessee Knoxville   (United States)

Author keywords

B. Glasses, metallic; B. Mechanical properties at ambient temperature; B. Phase transformations; C. Thin films

Indexed keywords

ELASTIC MODULI; MAGNETRON SPUTTERING; METALLIC GLASS; PHASE TRANSITIONS; TERNARY ALLOYS; X RAY DIFFRACTION ANALYSIS;

ATOMIC PERCENT; COMBINATORIAL SYNTHESIS; PHASE ANALYSES;

THIN FILMS;

EID: 34347223220     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.intermet.2007.02.011     Document Type: Article

References (40)

1. Peker A., and Johnson W.L. Applied Physics Letters 63 (2004) 2442
2. Xing L.Q., Eckert J., Loser W., and Schultz L. Applied Physics Letters 74 (2004) 664
3. Wang W.H., Wei Q., and Bai H.Y. Applied Physics Letters 71 (1997) 58
4. Peter W.H., Buchanan R.A., Liu C.T., and Liaw P.K. Journal of Non-Crystalline Solids 317 (2003) 187
5. Wang G.Y., Liaw P.K., Peter W.H., Yang B., Yokoyama Y., Benson M.L., et al. Intermetallics 12 (2004) 885
6. Inoue A., Zhang W., Zhang T., and Kurosaka K. Acta Materialia 49 (2001) 2645
7. Louzguine D.V., Yavari A.R., and Inoue A. Applied Physics Letters 86 (2005) 041906
8. Wang D., Li Y., Sun B.B., Sui M.L., Lu K., and Ma E. Applied Physics Letters 84 (2004) 4029
9. Qiao D.C., Liaw P.K., Fan C., Lin Y.H., Wang G.Y., Choo H., et al. Intermetallics 14 (2006) 1043
10. Barbee Jr. T.W., Walmsley R.G., Marshall A.F., Keith D.L., and Stevenson D.A. Applied Physics Letters 38 (1981) 132
11. Chu J.P., Liu C.T., Mahalingam T., Wang S.F., O'Keefe M.J., Johnson B., et al. Physical Review B: Condensed Matter and Materials Physics 69 (2004) 113410
12. Chiang C.L., Chu J.P., Liu F.X., Liaw P.K., and Buchanan R.A. Applied Physics Letters 88 (2006) 131902
13. Sharma P., Zhang W., Amiya K., Kimura H., and Inoue A. Journal of Nanoscience and Nanotechnology 5 (2005) 416
14. Sambandam S.N., Bhansali S., and Bhethanabotla V.R. Materials Research Society Symposium Proceedings 806 (2004) 177
15. Liu Y, Hata S, Wada K, Shimokohbe A. IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest, 14th Interlaken. Switzerland; Jan. 21-25, 2001. p. 102.
16. Xiang X.D., Sun X., Briceno G., Lou Y., Wang K.A., Chang H., et al. Science 268 (1995) 1738
17. Sun X.D., and Xiang X.D. Applied Physics Letters 72 (1998) 525
18. Wang J., Yoo Y., Gao C., Takeuchi I., Sun X., Chang H., et al. Science 279 (1998) 1712
19. Danielson E., Devenney M., Giaquinta D.M., Golden J.H., Haushalter R.C., McFarland E.W., et al. Science 279 (1998) 837
20. Danielson E., Golden J.H., McFarland E.W., Reaves C.M., Weinberg W.H., and Wu X.D. Nature 389 (1997) 944
21. Deng Y., Fowlkes J.D., Fitz-Gerald J.M., and Rack P.D. Applied Physics A: Materials Science & Processing A80 (2005) 787
22. Deng Y., Fowlkes J.D., Fitz-Gerald J.M., and Rack P.D. Optical Materials 29 (2006) 183
23. Fowlkes J.D., Fitz-Gerald J.M., and Rack P.D. Thin Solid Films 510 (2006) 68
24. Chang H., Gao C., Takeuchi I., Yoo Y., Wang J., Schultz P.G., et al. Applied Physics Letters 72 (1998) 2185
25. Wang Q., Perkins J., Branz H.M., Alleman J., Duncan C., and Ginley D. Applied Surface Science 189 (2002) 271
26. Klein K.L., Melechko A.V., Rack P.D., Fowlkes J.D., Meyer H.M., and Simpson M.L. Carbon 43 (2005) 1857
27. Klein K.L., Melechko A.V., Rack P.D., Hensley D.K., Fowlkes J.D., Meyer III H.M., Allard L.F., et al. Journal of Physical Chemistry B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical 110 (2006) 4766
28. Rar A., Frafjord J.J., Fowlkes J.D., Specht E.D., Rack P.D., Santella M.L., et al. Measurement Science and Technology 16 (2005) 46
29. Specht E.D., Rack P.D., Rar A., Pharr G.M., George E.P., Hong H., et al. Thin Solid Films 493 (2005) 307
30. Jun S.I., Rack P.D., McKnight T.E., Melechko A.V., and Simpson M.L. Journal of Applied Physics 97 (2005) 054906
31. Olk C.H., Tibbetts G.G., Simon D., and Moleski J.J. Journal of Applied Physics 94 (2003) 720
32. Yamauchi R., Hata S., Sakurai J., and Shimokohbe A. Japanese Journal of Applied Physics 45 (2006) 5911
33. Bei H., Lu Z.P., and George E.P. Physical Review Letters 93 (2004) 125504
34. Castellero A., Motyka M., Greer A.L., and Baricco M. Materials Science and Engineering, A: Structural Materials: Properties, Microstructure and Processing A375-A377 (2004) 250
35. Wei B.C., Zhang T.H., Li W.H., Sun Y.F., Yu Y., and Wang Y.R. Intermetallics 12 (2004) 1239
36. Arias D., and Abriata J.P. Bulletin of Alloy Phase Diagrams 11 (1990) 452
37. Oliver W.C., and Pharr G.M. Journal of Materials Research 7 (1992) 1564
38. Wang GY, Zhang Z, Keppens V, Liaw PK. Unpublished results.
39. Vaillant M.L., Keryvin V., Rouxel T., and Kawamura Y. Scripta Materialia 47 (2002) 19
40. Cullity B.D. Elements of X-ray diffraction. 2nd ed. (1978), Addison-Wesley Publishing Company, Inc., Reading, Massachusetts