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Volumn 6, Issue 1, 1995, Pages 1-7
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Calculation of thermal noise in atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 34347209835
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/6/1/001 Document Type: Article |
Times cited : (1380)
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References (18)
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