A 2 m inelastic X-ray scattering spectrometer at CMC-XOR, Advanced Photon Source

Journal of Synchrotron Radiation

Volumn 14, Issue 4, 2007, Pages 361-365

  Hill, J P ^a   Coburn, D S ^a   Kim, Y J ^a,b   Gog, T ^c   Casa, D M ^c   Kodituwakku, C N ^c,d   Sinn, H ^c  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TORONTO   (Canada)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d WESTERN MICHIGAN UNIVERSITY   (United States)

Author keywords

CMC XOR; Ge(733) analyzer; Inelastic X ray scattering; LaCuO; Medium resolution analyzer

Indexed keywords

GERMANIUM; METHOD OF MOMENTS; MONOCHROMATORS; OPTICAL DESIGN; PHOTONS; X RAY SCATTERING;

COUNTERWEIGHT DESIGN; INELASTIC X-RAY SCATTERING; MEDIUM-RESOLUTION ANALYZERS; SCATTERING PLANES;

X RAY SPECTROMETERS;

EID: 34250897413     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049507018006     Document Type: Article

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