Effective test driven development for embedded software

2006 IEEE International Conference on Electro Information Technology

Volumn , Issue , 2006, Pages 382-387

  Karlesky, Michael J ^a   Bereza, William I ^a   Erickson, Carl B ^a  

^a Atomic Object LLC   (United States)

Author keywords

Design for testability; Microprogramming; Software quality; Software testing

Indexed keywords

AUTOMATION; EMBEDDED SYSTEMS; INFORMATION TECHNOLOGY; QUALITY CONTROL; RANDOM ACCESS STORAGE; RISK MANAGEMENT; SOFTWARE TESTING;

PROGRAM MEMORY; RESOURCE CONSTRAINED SYSTEMS; SOFTWARE QUALITY;

SOFTWARE ENGINEERING;

EID: 34250857338     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EIT.2006.252188     Document Type: Conference Paper

References (10)

1. Kent Beck, Extreme Programming Explained, Reading, MA: Addison Wesley, 2000.
2. Wolfgang Schmitt. "Automated Unit Testing of Embedded ARM Applications." Information Quarterly, Volume 3, Number 4, p. 29, 2004.
3. David Astels, Test Driven Development: A Practical Guide, Upper Saddle River, NJ: Prentice Hall PTR, 2003.
4. "Unit Test." http://en.wikipedia.org/wiki/Unit_test.
5. Erich Gamma, Richard Helm, Ralph Johnson, John Vlissides, Design Patterns: Elements of Reusable Object-Oriented Software, Reading, MA: Addison-Wesley Professional Computing Series, 1995.
6. Martin Fowler. "Model View Presenter." http://www.martinfowler. com/eaaDev/ModelViewPresenter.html. July 2004.
7. M. Alles, D. Crosby, C. Erickson, B. Harleton, M. Marsiglia, G. Pattison, C. Stienstra. "Presenter First: Organizing Complex GUI Applications for Test-Driven Development," accepted at Agile 2006 conference, Minneapolis, MN.
8. Kent Beck, "Simple Smalltalk Testing: With Patterns." http://www.xprogramming.com/testfram.htm.
9. http://www.atomicobject.com/embeddedtesting.page.
10. "Continuous Integration." http://en.wikipedia.org/wiki/ Continuous_integration.