Initial Risk Analysis of Potential Failure Modes

Performance and Durability Assessment: Optical Materials for Solar Thermal Systems

Volumn , Issue , 2004, Pages 147-157

  Carlsson, B ^a  

^a SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

C (PROGRAMMING LANGUAGE); DEGRADATION; DURABILITY; FAILURE MODES; MATERIALS TESTING; RISK ANALYSIS; RISK ASSESSMENT; RISK PERCEPTION;

ACCEPTABLE PERFORMANCE; CRITICAL FAILURES; DEGRADATION MECHANISM; EFFECT ANALYSIS; FUNCTIONAL PROPERTIES; POINT OF DEPARTURES; POTENTIAL FAILURE MODES; POTENTIAL FAILURES;

FAILURE ANALYSIS;

EID: 34250856294     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-008044401-7/50013-4     Document Type: Chapter

References (13)

1. Al-Sheikhly M., Christou A. How Radiation Affects Polymeric Materials. IEEE Trans. Reliability 1994 December, 43:551-556.
2. Black J.R. Electromigration - A Brief Survey and Some Recent Results. IEEE Trans. Electron Devices 1969 April, ED-16:338-347.
3. Carlsson B., Berglund hman A., Jutengren K. Assessment of Service Life by Accelerated Testing - Methodology for Qualification of Rust Protective Paint Systems. SP Swedish National Testing and Research Institute, SP-Report 1995:65 1995, ISBN 91-7848-592-4 (Swedish), SE-50115 Bors, Sweden.
4. Carlsson B., Frei U., Köhl M., Möller K. Accelerated Life Testing of Solar Energy Materials - Case Study of Some Selective Solar Absorber Coatings for DHW systems, International Energy Agency, Solar Heating and Cooling Programme Task X: Solar Materials Research and Development, Technical Report. SP- Report 1994:13 1994, SE-50115 Bors, Sweden.
5. Dasgupta A., Pecht M. Material Failure-mechanisms and Damage Models. IEEE Trans. Reliability 1991, 40:531-536.
6. DiGiacomo Metal Migration (Ag, Cu, Pb) in Encapsulated Modules and Time-to-fail Model as a Function of the Environment and Package Properties. IEEE Proc. Int'l Reliability Physics Symp. 1982, 27-33.
7. Failure More and Effect Analysis Instruction manual from Volvo Car Corporation. Failure Mode and Effect Analysis 1993, Stockholm, Sweden, Ord & Form AB. C. Britsman, . Lönnqvist, S.O. Ottosson (Eds.).
8. Analysis Techniques for System Reliability - Procedure for Failure Mode and Effect Analysis (FMEA). IEC Standard, Publ. No. 812 1985, CH-1211 Geneva 20, Switzerland.
9. Krumbein S.J. Electrolytic Models for Metallic Electromigration Failure Mechanisms. IEEE Trans. Reliability 1995 December, 44:539-549.
10. Li, Dasgupta A. Failure-mechanism Models for Material Aging due to Interdiffusion. EEE Trans. Reliability 1994, March, 43:2-10.
11. Nitta T., et al. Evaluating the Large Electromigration Resistance of Copper Interconnects Employing a Newly Developed Accelerated Life-test Method. J. Electrochem. Soc. 1993 April, 140:1131-1137.
12. Tullmin M., Roberge P.R. Corrosion of Metallic Materials. IEEE Trans. Reliability 1995 June, 44:271-278.
13. Young D., Christou A. Failure-mechanism Models for Electromigration. IEEE Trans. Reliability 1994, June, 43:186-192.