Spectroscopy and high-resolution microscopy of single nanocrystals by a focused ion beam registration method

Angewandte Chemie - International Edition

Volumn 46, Issue 19, 2007, Pages 3517-3520

  Novo, Carolina ^a   Funston, Alison M ^a   Pastoriza Santos, Isabel ^b   Liz Marzán, Luis M ^b   Mulvaney, Paul ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b UNIVERSITY OF VIGO   (Spain)

Author keywords

Electron microscopy; Focused ion beam; Morphology; Single particle studies; Surface plasmon resonance

Indexed keywords

DATA ACQUISITION; ION BEAM ASSISTED DEPOSITION; MICROSCOPIC EXAMINATION; SPECTROSCOPIC ANALYSIS;

FOCUSED ION BEAM; SINGLE-PARTICLE STUDIES;

NANOCRYSTALS;

EID: 34250819938     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/anie.200700033     Document Type: Article

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