Design of Perimeter Estimators for Digitized Planar Shapes

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 11, Issue 6, 1989, Pages 611-622

  Koplowitz, Jack ^a   Bruckstein, Alfred M ^b  

^a CLARKSON UNIVERSITY   (United States)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Binary images; digitized planar shapes; estimation of perimeter; line drawings; perimeter measurement of quantized objects

Indexed keywords

EID: 34250816152     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.24795     Document Type: Article

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