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Volumn 40, Issue 6, 2007, Pages 74-76

Reliability assessment by use-rate acceleration

Author keywords

[No Author keywords available]

Indexed keywords


EID: 34250796253     PISSN: 0033524X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (4)

References (9)
  • 4
    • 0004734621 scopus 로고    scopus 로고
    • Product Life Data Analysis: A Case Study
    • June
    • Necip Doganaksoy, Gerald J. Hahn and William Q. Meeker, "Product Life Data Analysis: A Case Study," Quality Progress, June 2000, pp. 115-121.
    • (2000) Quality Progress , pp. 115-121
    • Doganaksoy, N.1    Hahn, G.J.2    Meeker, W.Q.3
  • 7
    • 0036607334 scopus 로고    scopus 로고
    • Divide and Conquer: Reliability Analysis by Individual Failure Modes
    • June
    • Necip Doganaksoy, William Q. Meeker and Gerald J. Hahn, "Divide and Conquer: Reliability Analysis by Individual Failure Modes," Quality Progress, June 2002, pp. 47-52.
    • (2002) Quality Progress , pp. 47-52
    • Doganaksoy, N.1    Meeker, W.Q.2    Hahn, G.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.