Characterization of Polymethyl Methacrylate (PMMA) layers for OTFTs gate dielectric

Proceedings of the Sixth International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2006 - Final Program and Technical Digest

Volumn , Issue , 2006, Pages 375-377

  Mejia, Israel ^a   Estrada, Magali ^a  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACE STATES; ORGANIC THIN FILM TRANSISTORS;

CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC FILMS; GATES (TRANSISTOR); PHOTORESISTS; SILICA; SILICON WAFERS; THIN FILM TRANSISTORS;

POLYMETHYL METHACRYLATES;

EID: 34250777026     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCDCS.2006.250890     Document Type: Conference Paper

References (4)

1. J. Puigdollers, C. Voz, A. Orpella, R. Quidant, I. Martín, M. Vetter and R. Aloubilla, "Pentacene thin-film transistors with polymeric gate dielectric" Organic Electronics, vol. 5, pp. 67-71, 2004.
2. Microlithography Chemical Corp., 1254 Chestnut St., Newton, MA 02464.
3. Tables of physical magnitudes, edited by I.K. Kikoina, Moskva-Atomizdat 1976, (in russian) page 324.
4. O. R. Fowles, "Introduction to Modem Optics", Holt, Rinehart & Winston, New York, (1968).