Growth and characterization of cobalt thiourea sulfate, a new nonlinear optical material

Materials Letters

Volumn 61, Issue 19-20, 2007, Pages 4173-4176

  Kirubavathi, K ^a   Selvaraju, K ^a   Valluvan, R ^a   Kumararaman, S ^b  

^a THANTHAI HANS ROEVER COLLEGE   (India)

^b NEHRU MEMORIAL COLLEGE   (India)

Author keywords

NLO property; Solution growth technique; X ray diffraction

Indexed keywords

CHARACTERIZATION; EVAPORATION; GROWTH (MATERIALS); HARMONIC GENERATION; MICROHARDNESS; OPTICAL MATERIALS; SINGLE CRYSTAL SURFACES; SOLVENTS; UREA; VICKERS HARDNESS; X RAY DIFFRACTION;

SINGLE CRYSTAL X-RAY DIFFRACTION; UNIT CELL PARAMETERS; VICKER'S MICROHARDNESS METHOD;

COBALT COMPOUNDS;

EID: 34250773310     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2007.01.082     Document Type: Article

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