Study on SVM-based analog electronic system multiple fault diagnosis

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 28, Issue 6, 2007, Pages 1029-1034

  Lian, Ke ^a   Wang, Houjun ^a   Long, Bing ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Multi class support vector machine; Multiple fault diagnosis; Wavelet transform

Indexed keywords

EID: 34250768924     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)