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Volumn 150, Issue 9, 2006, Pages 30-

Competition heats up between tech exams

(1)  Gebhart, Fred a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA BASE; EXAMINATION; GOVERNMENT; INTERNET; KNOWLEDGE; MEDICAL EDUCATION; MEDICAL SOCIETY; SHORT SURVEY;

EID: 34250758046     PISSN: 00126616     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Short Survey
Times cited : (2)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.