Scintillation light, ionization yield and scintillation decay times in high pressure xenon and xenon methane

IEEE Transactions on Nuclear Science

Volumn 54, Issue 3, 2007, Pages 744-750

  Pushkin, K N ^a,b   Akimov, D Y ^c   Burenkov, A A ^c   Dmitrenko, V V ^a,b   Kovalenko, A G ^c   Lebedenko, V N ^d   Kuznetsov, I S ^c   Stekhanov, V N ^c   Tezuka, C ^e   Ulin, S E ^b   Uteshev, Z M ^b   Vlasik, K F ^b  

^a IEEE   (Russian Federation)

^b NATIONAL RESEARCH NUCLEAR UNIVERSITY MEPHI   (Russian Federation)

^c INSTITUTE FOR THEORETICAL AND EXPERIMENTAL PHYSICS   (Russian Federation)

^d IMPERIAL COLLEGE LONDON   (United Kingdom)

^e WASEDA UNIVERSITY   (Japan)

Author keywords

High pressure xenon detectors; Ionization yield; Scintillation light; Time protection chamber; Xenon methane mixture

Indexed keywords

ELECTRIC FIELD STRENGTH; HIGH PRESSURE XENON DETECTORS; IONIZATION YIELD; TIME PROTECTION CHAMBER; XENON-METHANE MIXTURE;

DECAY (ORGANIC); ELECTRIC FIELDS; ELECTRONS; IONIZATION; METHANE; XENON;

SCINTILLATION;

EID: 34250747299     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.894815     Document Type: Article

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