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Volumn 52, Issue 5, 2005, Pages 65-75
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Machine vision looks well beyond inspection
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 34250684587
PISSN: 00108049
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (0)
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