Measurement of the spatial uniformity of a large field microstructured retarder

2006 International Conference on Transparent Optical Networks

Volumn 4, Issue , 2006, Pages 170-173

  Urbanczyk, Adam ^a   Schumann, Melanie ^b   Bläsi, Benedikt ^b   Gombert, Andreas ^b  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Form birefringence; Microstructured optical elements; Retardation plate

Indexed keywords

BIREFRINGENCE; LITHOGRAPHY; MICROSTRUCTURE; WAVELENGTH;

FORM BIREFRINGENCE; MICROSTRUCTURED OPTICAL ELEMENTS; RETARDATION DISTRIBUTION; RETARDATION PLATE;

OPTICAL DEVICES;

EID: 34250674553     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICTON.2006.248530     Document Type: Conference Paper

References (2)

1. S. Johnson, J. Joannopoulos, "Photonic crystals: the road from theory to practice" Boston : Kluwer, Academic Publishers, 2002.
2. R. Azzam, N. Bashara, "Ellipsometry and polarized light," Amsterdam, North-Holland Publishing Company, 1977.