Electrodeposition and characterization of HgSe thin films

Materials Characterization

Volumn 58, Issue 8-9 SPEC. ISS., 2007, Pages 735-739

  Mahalingam, T ^a,d   Kathalingam, A ^a   Sanjeeviraja, C ^a   Chandramohan, R ^b   Chu, J P ^c   Kim, Yong Deak ^d   Velumani, S ^e  

^a ALAGAPPA UNIVERSITY   (India)

^b NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^c NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^d Ajou University   (South Korea)

^e SCHOOL OF ENGINEERING AND SCIENCES   (Mexico)

Author keywords

Electrodeposition; Mercury selenide; Semimetals; Thin films

Indexed keywords

ELECTROCHEMISTRY; ELECTRODEPOSITION; ENERGY DISPERSIVE X RAY ANALYSIS; MERCURY COMPOUNDS; OPTICAL BAND GAPS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELECTROLYTE BATH COMPOSITION; MERCURY SELENIDE (HGSE); OPTICAL ABSORPTION TECHNIQUES;

THIN FILMS;

EID: 34250672336     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.11.022     Document Type: Article

References (9)

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