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Volumn 51, Issue 4, 2007, Pages 525-529
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Precision X-ray optical depth measurements in ICF shells
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Author keywords
[No Author keywords available]
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Indexed keywords
BERYLLIUM;
COPPER;
OPTICAL VARIABLES MEASUREMENT;
RADIOGRAPHY;
SURFACE MEASUREMENT;
X RAYS;
ABLATOR MATERIALS;
LAYER FLUCTUATION;
PRECISION RADIOGRAPHY SYSTEM;
INERTIAL CONFINEMENT FUSION;
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EID: 34250666149
PISSN: 15361055
EISSN: None
Source Type: Journal
DOI: 10.13182/FST51-525 Document Type: Conference Paper |
Times cited : (16)
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References (5)
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