Solution processed pentacene thin films and their structural properties

Materials Science and Engineering: B

Volumn 140, Issue 1-2, 2007, Pages 1-4

  Tao, Chun Lan ^a   Zhang, Xu Hui ^a   Zhang, Fu Jia ^a   Liu, Yi Yang ^b   Zhang, Hao Li ^b  

^a LANZHOU UNIVERSITY   (China)

^b LANZHOU UNIVERSITY   (China)

Author keywords

AFM; Characterization; Pentacene; SEM; Solution processing; Thin films; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; ORGANIC SOLVENTS; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

OPTIMUM TEMPERATURE; PENTACENE;

THIN FILMS;

EID: 34250659706     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.01.028     Document Type: Article

References (23)

1. Volkel A.R., Street R.A., and Knopp D. Phys. Rev. B 66 (2002) 195336
2. Forrest S., Burrows P., and Thompson M. IEEE Spectrum 37 (2000) 29
3. Campbell I.H., and Smith D.L. Soild State Phys. 55 (2001) 1
4. Yang Y.S., Kim A.H., Lee J., Chu H.Y., Do L.M., Lee H., Oh J., and Zyung T. Appl. Phys. Lett. 80 (2002) 1595
5. Sirringhaus H., Buergi L., Kawase T., and Friend R.H. In: Kagan C.R., and Andry P. (Eds). Thin Film Transistors (2003), Marcel Dekker, Now York 427
6. S.R. Forrest, Nature 2-4, 428, 911.
7. Lin Y.Y., Gundlach D.J., Nelson S.F., and Jackson T.N. IEEE Trans. Electron Devices 44 (1997) 1325
8. Dimitrakopoulos C.D., and Malenfant P.R.L. Adv. Mater. (Weinheim, Ger.) 14 (2002) 99
9. Horowitz G. J. Mater. Res. (2004)
10. Lee J., Kim J.H., Im S., and Jung D.-Y. Appl. Phys. 96 (2004) 2301
11. Jurchescu O.D., Baas J., and Palstra T.T.M. Appl. Phys. 84 (2004) 3061
12. Kudo K., Yamashina M., and Moriizuni T. Jpn. J. Appl. Phys. 123 (1984) 130
13. Horowitz G., Fichou D., Peng X., Xu Z., and Garnier F. Solid State Commun. 72 (1989) 381
14. Gundlach D.J., Lin Y.Y., Jackson T.N., Nelson S.F., and Schlom D.G. IEEE Electron Device Lett. 18 (1997) 87
15. Sirringhaus H., Tessler N., and Friend R.H. Science 280 (1998) 1741
16. Tang C.W., and VanSlyke S.A. Appl. Phys. Lett. 51 (1987) 913
17. Friend R.H., Gymer R.W., Holmes A.B., Burroughes J.H., Marks R.N., Taliani C., Bradley D.D.C., Dos Santos D.A., Brédas J.L., Lögdlund M., and Salaneck W.R. Nature (Lond.) 397 121 (1999) ([Inspeet] [ISI])
18. S.E. Shaheen, C.J. Brabec, N.S. Sariciftci, F. Padinger, T. Fromherz, J.C. Hummelen, Appl. Phys. Lett. 78 (2000) 841 ([ISI]).
19. Peumans P., Uchida S., and Forrest S.R. Nature (Lond.) 425 (2003) 158 ([ISI] [MEDLINE])
20. Brown A.R., Pomp A., Deleeuw D.M., Klaassen D.B.M., and Havinga E.E. Appl. Phys. 79 (1996) 2136
21. Minakata T., and Natsume Y. Synth. Met. 153 (2005) 1-4
22. Minakata T., Imai H., Ozaki M., and Saco K. J. Appl. Phys. 72 (1992) 5220
23. Minakata T., Nagoya I., and Ozaki M. J. Appl. Phys. 69 10 (1991) 7354