A nanotechnology test system

EE: Evaluation Engineering

Volumn 46, Issue 6, 2007, Pages 44-48

  Skarupo, Sergei ^a,b  

^a Nanomix ^*  (United States)

^b NATIONAL TECHNICAL UNIVERSITY OF UKRAINE   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

MULTIPLEXER CARDS; SEMI AUTOMATIC PROBERS; SEQUENCE CONTROL; SILICON WAFER PROBERS;

BIOMOLECULES; CARBON NANOTUBES; ELECTRIC PROPERTIES; FIELD EFFECT TRANSISTORS; SILICON WAFERS;

NANOTECHNOLOGY;

EID: 34250651710     PISSN: 01490370     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (0)