Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin films

Materials Characterization

Volumn 58, Issue 8-9 SPEC. ISS., 2007, Pages 715-720

  Venkatachalam, S ^a   Soundararajan, D ^a   Peranantham, P ^a   Mangalaraj, D ^a   Narayandass, Sa K ^a   Velumani, S ^b   Schabes Retchkiman, P ^c  

^a BHARATHIAR UNIVERSITY   (India)

^b SCHOOL OF ENGINEERING AND SCIENCES   (Mexico)

^c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Composition; I V; Spectroscopic ellipsometry; Structure; Thin films

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; OPTICAL PROPERTIES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTROSCOPIC ELLIPSOMETRY; VACUUM EVAPORATION; X RAY DIFFRACTION; ZINC COMPOUNDS;

CRYSTALLINE QUALITY; DISLOCATION DENSITY; GLASS SUBSTRATES; OPTICAL TRANSMITTANCE MEASUREMENTS;

THIN FILMS;

EID: 34250647081     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.11.026     Document Type: Article

References (23)

1. Tsuguru S. Effect of defects on the degradation of ZnSe-based white LEDs. Mater Sci Eng B Solid-State Mater Adv Technol 91-92 (2002) 470-475
2. Gurskii A.L., Marko I.P., Yuvchenko V.N., Yablonskii G.P., Hamadeh H., Taudt W., et al. Near-band-edge photoluminescence of MOVPE-grown undoped and nitrogen-doped ZnSe. J Cryst Growth 174 (1997) 757-762
3. Rumberg A., Sommerhalter Ch., Toplak M., Jager-Waldau A., and Lux-Steiner M.Ch. ZnSe thin films grown by chemical vapour deposition for application as buffer layer in CIGSS solar cells. Thin Solid Films 361-362 (2000) 172-176
4. Rizzo A., Tagliente M.A., Caneve L., and Scaglione S. The influence of the momentum transfer on the structural and optical properties of ZnSe thin films prepared by r.f. magnetron sputtering. Thin Solid Films 368 1 (2000) 8-14
5. Miyajima T., Ozawa M., Asatsuma T., Kawai H., and Ikeda M. Minority carrier diffusion length in GaN and ZnSe. J Cryst Growth 189-190 (1998) 768-772
6. Wolverson D., Boyce P.J., Townsley C.M., Schlichtherle B., and Davies J.J. Spin-flip Raman scattering studies of doped epitaxial zinc selenide. J Cryst Growth 159 1-4 (1996) 229-237
7. Kalita P.K.R., Sarma B.K., and Das H.C. Structural characterization of vacuum evaporated ZnSe thin films. Bull Mater Sci 23 4 (2000) 313-317
8. Joint committee on powder diffraction standards, File No. 9-387 (1990) (XRD).
9. Jamieson D.N. Structural and electrical characterisation of semiconductor materials using a nuclear microprobe. Nucl Instrum Methods Phys Res B Beam Interact Mater Atoms 136-138 (1998) 1-13
10. Doolittle L.R. Algorithms for the rapid simulation of Rutherford backscattering spectra. Nucl Instrum Methods Phys Res B Beam Interact Mater Atoms 9 3 (1985) 344-351
11. Tolansky S. Multiple beam interferometry of surfaces and films (1948), Oxford University press, Oxford 147
12. Venkatachalam S., Mangalaraj D., Narayandass Sa.K., Kim K., and Yi J. Structure, optical and electrical properties of ZnSe thin films. Physica B 358 1-4 (2005) 27-35
13. 0.4Te thin films. Mater Sci Eng B Solid-State Mater Adv Technol 107 1 (2004) 99-105
14. 0.48/Si Schottky diodes. Solid-State Electron 48 (2004) 2219-2223
15. Harbeke G. In: Abeles F. (Ed). Optical properties of solids (1972), North Holland, Amsterdam 21
16. Adachi S., and Taguchi T. Optical properties of ZnSe. Phys Rev B 43 12 (1991) 9569-9577
17. Chelikowsky J.R., and Cohen M.L. Nonlocal pseudopotential calculations for the electronic structure of eleven diamond and zinc-blende semiconductors. Phys Rev B 14 (1976) 556-582
18. Walter J.P., Cohen M.L., Petroff Y., and Balkanski M. Calculated and measured reflectivity of ZnTe and ZnSe. Phys Rev B 1 (1970) 2661-2667
19. Kim Y.-D., Cooper S.L., Klein M.V., and Jonker B.T. Optical characterization of pure ZnSe films grown on GaAs. Appl Phys Lett 62 19 (1993) 2387-2389
20. Kim C.C., and Sivananthan S. Optical properties of ZnSe and its modeling. Phys Rev B 53 (1996) 1475-1484
21. 0.13Se epilayers determined by spectroscopic ellipsometry. Thin Solid Films 445-456 (2004) 228-230
22. Venkata Y.P., Subbaiah P., Prathap M., Devika K.T., and Ramakrishna R. Close-spaced evaporated ZnSe films: Preparation and characterization. Physica B 365 (2005) 240-246
23. Basol B.M., and Stafudd D.M. Observation of electron traps in electrochemically deposited CdTe films. Solid-State Electron 24 (1981) 121-125