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Volumn , Issue , 2006, Pages 1233-1236
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Microwave breakdown in RF devices containing sharp corners
a b c c a a d e e |
Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
COMPUTER SIMULATION;
ELECTRIC BREAKDOWN;
ELECTRIC FIELDS;
NUMERICAL METHODS;
FIELD SINGULARITY;
MICROWAVE BREAKDOWN;
RF DEVICES;
VOLUMETRIC PROCESS;
MICROWAVE DEVICES;
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EID: 34250374890
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MWSYM.2006.249433 Document Type: Conference Paper |
Times cited : (6)
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References (6)
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