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Volumn 27, Issue 3, 2007, Pages 264-268
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Electromagnetic shielding fabrics with magnetron sputtered copper coating
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Author keywords
Atomic force microscopy; DC magnetron sputtering; Electromagnetic shield performance; Surface resistance
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEPOSITION RATES;
ELECTROMAGNETIC SHIELDING;
FILMS;
MAGNETRON SPUTTERING;
SCANNING ELECTRON MICROSCOPY;
SURFACE MORPHOLOGY;
SURFACE RESISTANCE;
COPPER FILMS;
DC MAGNETRON SPUTTERING;
ELECTROMAGNETIC SHIELD PERFORMANCE;
COPPER;
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EID: 34250369647
PISSN: 16727126
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (14)
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