Sequential testing for comparison of the mean time between failures for two systems

IEEE Transactions on Reliability

Volumn 56, Issue 2, 2007, Pages 321-331

  Michlin, Yefim H ^a   Grabarnik, Genady Ya ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

MTBF ratio; Sequential testing; Test truncation

Indexed keywords

ALGORITHMS; FAILURE MODES; PROBABILITY DISTRIBUTIONS; RECURSIVE FUNCTIONS;

BINOMIAL PATTERN; EXPONENTIAL DISTRIBUTION; SEQUENTIAL PROBABILITY RATIO TEST; TRUNCATION APEX;

SYSTEMS ANALYSIS;

EID: 34250332188     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2007.896679     Document Type: Article

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