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Volumn 68, Issue 5-6, 2007, Pages 1079-1082
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Defect structure of Bi2-xAsxTe3 single crystals
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Author keywords
A. Chalcogenides; B. Crystal growth; D. Transport properties
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Indexed keywords
ABSORPTION SPECTROSCOPY;
CARRIER CONCENTRATION;
CHALCOGENIDES;
CRYSTAL GROWTH;
POINT DEFECTS;
SINGLE CRYSTALS;
TRANSPORT PROPERTIES;
X RAY DIFFRACTION ANALYSIS;
ATOMIC ABSORPTION SPECTROSCOPY;
FREE CARRIERS CONCENTRATION;
POINT DEFECT MODELS;
BISMUTH COMPOUNDS;
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EID: 34250189883
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpcs.2006.12.030 Document Type: Article |
Times cited : (3)
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References (10)
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