메뉴 건너뛰기




Volumn 68, Issue 5-6, 2007, Pages 1079-1082

Defect structure of Bi2-xAsxTe3 single crystals

Author keywords

A. Chalcogenides; B. Crystal growth; D. Transport properties

Indexed keywords

ABSORPTION SPECTROSCOPY; CARRIER CONCENTRATION; CHALCOGENIDES; CRYSTAL GROWTH; POINT DEFECTS; SINGLE CRYSTALS; TRANSPORT PROPERTIES; X RAY DIFFRACTION ANALYSIS;

EID: 34250189883     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.12.030     Document Type: Article
Times cited : (3)

References (10)
  • 6
    • 34250214306 scopus 로고    scopus 로고
    • T. Roisnel, J. Rodriguez-Carvajal, in: Proceedings of the EPDIC 7, May 2000, Barcelona, Spain, Trans Tech Publications, Enfield, NH, 2001, p. 118.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.