In-situ recrystalllzation imaging of polycrystalline Ni-S alloy using SEM

Materials Research Society Symposium Proceedings

Volumn 907, Issue , 2005, Pages 63-67

  Cornen, Marilync ^a   Le Gall, René ^a  

^a UNIVERSITÉ DE NANTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL IMPURITIES; CRYSTAL ORIENTATION; ELECTROCHEMICAL ETCHING; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SURFACE SEGREGATION;

CHANNEL PLATES; ELECTROCHEMICAL TECHNIQUES; RECRYSTALLLZATION IMAGING; SECONDARY ELECTRON DETECTORS;

NICKEL ALLOYS;

EID: 34249949090     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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