Nanoscale measurements in organic memory devices from C60 in insulating polymers

Materials Research Society Symposium Proceedings

Volumn 905, Issue , 2005, Pages 59-64

  Kanwal, Alokik ^a   Chhowalla, Manish ^a  

^a The State University of New Jersey   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; ELECTRIC INSULATING MATERIALS; ELECTRON BEAM LITHOGRAPHY; FULLERENES; ORGANIC POLYMERS;

CELL DEVICES; INSULATING POLYMERS; ORGANIC MEMORY DEVICES;

DATA STORAGE EQUIPMENT;

EID: 34249945596     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0905-dd06-03     Document Type: Conference Paper

References (5)

1. S. R. Forrest, Nature 428, 911 (2004).
2. A. Kanwal, S. Paul, M. Chhowalla, Materials Research Society Symposium Proceeding 830 (2004).
3. S. Paul, A. Kanwal, M. Chhowalla, Nanotechnology Accepted (2005).
4. J, Ouyang, C. W. Chu, C. R. Szmanda, L. Ma, Y. Yang, Nature Materials 3, 918-922 (2004).
5. D. Braun, Journal of Polymer Science: Part B: Polymer Physics 41, 2622-2629 (2003).