Accurate particle position measurement from images

Review of Scientific Instruments

Volumn 78, Issue 5, 2007, Pages

  Feng, Y ^a   Goree, J ^a   Liu, Bin ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METHOD OF MOMENTS; PARTICLE BEAM TRACKING; PIXELS; POSITION MEASUREMENT; VELOCITY MEASUREMENT;

PARTICLE POSITION; PIXEL LOCKING; RANDOM NOISE; SUBPIXEL ESTIMATION;

IMAGE ANALYSIS;

NANOMATERIAL;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; COMPUTER ASSISTED DIAGNOSIS; DUST; EVALUATION; IMAGE QUALITY; IMAGE SUBTRACTION; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; ULTRASTRUCTURE;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; DUST; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, VIDEO; NANOSTRUCTURES; PHANTOMS, IMAGING; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SUBTRACTION TECHNIQUE;

EID: 34249940378     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2735920     Document Type: Article

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