Attenuated total reflection

Chemical Analysis

Volumn 171, Issue , 2007, Pages 321-348

  Griffiths, Peter R ^a   De Haseth, James A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34249940075     PISSN: 00692883     EISSN: None     Source Type: Book Series    
DOI: 10.1002/9780470106310.ch15     Document Type: Review

References (6)

1. S. Nunn and K. Nishikida, Advanced ATR Correction Algorithm, Application Note 01153, Thermo Electron Corporation.
2. N. J. Harrick, Internal Reflection Spectroscopy, Harrick Scientific Corporation, Pleasantville, NY, 1967.
3. M. Milosevic, S. L. Berets, and A. Y. Fadeev, Appl. Spectrosc. 57, 724 (2003).
4. M. E. Mulcahy, S. L. Berets, M. Milosevic, and J. Michl, J. Phys. Chem. B 108, 1519 (2004).
5. R. Krska, K. Taga, and R. Kellner, Appl. Spectrosc. 47, 1484 (1993).
6. J. A. de Haseth, J. E. Andrews, J. V. McCluskey, R. D. Priester, Jr., M. A. Harthcock, and B. L. Davis, Appl. Spectrosc. 47, 173 (1993).