In situ studies of metal passive films

Current Opinion in Solid State and Materials Science

Volumn 10, Issue 3-4, 2006, Pages 144-152

  Díez Pérez, Ismael ^a   Sanz, Fausto ^a   Gorostiza, Pau ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

Author keywords

Chloride corrosion; Copper; ECTS; EIS; Electrochemical STM; Electrochemical tunneling spectroscopy; Iron; Nickel; Oxide; Passivity; Semiconductor electrochemistry; SERS; Tin; Voltammetry; XANES; XRD

Indexed keywords

CHEMICAL COMPOUNDS; COPPER; ELECTRONIC PROPERTIES; IRON; MECHANISMS; NICKEL; X RAY DIFFRACTION;

CHLORIDE CORROSION; POTENTIOSTATIC CONTROL; SEMICONDUCTOR ELECTROCHEMISTRY;

OXIDE FILMS;

EID: 34249933481     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cossms.2007.01.002     Document Type: Article

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