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Volumn 191, Issue 1-3, 2007, Pages 364-367

Optical detection of conduction/keyhole mode transition in laser welding

Author keywords

Laser welding; Plasma spectroscopy

Indexed keywords

CORRELATION METHODS; PLASMA DIAGNOSTICS; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; THERMAL PLUMES; COMPUTER APPLICATIONS; COMPUTER SIMULATION;

EID: 34249913954     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmatprotec.2007.03.075     Document Type: Article
Times cited : (67)

References (7)
  • 1
    • 0035422093 scopus 로고    scopus 로고
    • A fuzzy pattern recognition based system for monitoring laser weld quality
    • Park H., Rhee S., and Kim D. A fuzzy pattern recognition based system for monitoring laser weld quality. Meas. Sci. Technol. 12 (2001) 1318-1324
    • (2001) Meas. Sci. Technol. , vol.12 , pp. 1318-1324
    • Park, H.1    Rhee, S.2    Kim, D.3
  • 2
    • 0036498223 scopus 로고    scopus 로고
    • 2 laser weld quality for automotive industry
    • 2 laser weld quality for automotive industry. Opt. Laser Technol. 34 (2002) 134-142
    • (2002) Opt. Laser Technol. , vol.34 , pp. 134-142
    • Park, H.1    Rhee, S.2
  • 4
    • 33646115188 scopus 로고    scopus 로고
    • A study of the shielding gas influence on the laser beam welding of AA5083 aluminium alloys by in process spectroscopic investigation
    • Sibillano T., Ancona A., Berardi V., Schingaro E., Basile G., and Lugarà P.M. A study of the shielding gas influence on the laser beam welding of AA5083 aluminium alloys by in process spectroscopic investigation. Opt. Laser Eng. 44 (2006) 1039-1051
    • (2006) Opt. Laser Eng. , vol.44 , pp. 1039-1051
    • Sibillano, T.1    Ancona, A.2    Berardi, V.3    Schingaro, E.4    Basile, G.5    Lugarà, P.M.6
  • 6
    • 0035421420 scopus 로고    scopus 로고
    • A plasma cloud charge sensor for pulse keyhole process control
    • Zhang Y.M., Zhang S.B., and Liu Y.C. A plasma cloud charge sensor for pulse keyhole process control. Meas. Sci. Technol. 12 (2001) 1365-1370
    • (2001) Meas. Sci. Technol. , vol.12 , pp. 1365-1370
    • Zhang, Y.M.1    Zhang, S.B.2    Liu, Y.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.