Analysis of surface degradation of silicone rubber insulation due to tracking under different voltage profiles

Electrical Engineering

Volumn 89, Issue 6, 2007, Pages 489-501

  Chandrasekar, S ^a   Sarathi, R ^a   Danikas, M G ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^b DEMOCRITUS UNIVERSITY OF THRACE   (Greece)

Author keywords

Activation energy; Contact angle; Diffusion coefficient; DMA test; Leakage current; Moving average; Silicone rubber; Tensile test; TG DTA; Tracking; WAXD

Indexed keywords

ACTIVATION ENERGY; CONTACT ANGLE; DIFFERENTIAL THERMAL ANALYSIS; DIFFUSION; ELECTRIC INSULATION; LEAKAGE CURRENTS; SILICONES; TENSILE TESTING;

DMA TESTS; SILICONE RUBBERS; TRACKING MECHANISM;

RUBBER;

EID: 34249912623     PISSN: 09487921     EISSN: 14320487     Source Type: Journal    
DOI: 10.1007/s00202-006-0029-z     Document Type: Article

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