Progress and application of the Tohoku microbeam system

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 260, Issue 1, 2007, Pages 55-64

  Matsuyama, S ^a   Ishii, K ^a   Yamazaki, H ^a   Kikuchi, Y ^a   Inomata, K ^a   Watanabe, Y ^a   Ishizaki, A ^a   Oyama, R ^a   Kawamura, Y ^a   Yamaguchi, T ^a   Momose, G ^a   Nagakura, M ^a   Takahashi, M ^a   Kamiya, T ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

3D CT; Grid shadow method; HMI; Microbeam; Parasitic field contamination; PIXE; RBS; STIM

Indexed keywords

CONTAMINATION; HUMAN COMPUTER INTERACTION; OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; SILICON; TUNGSTEN CARBIDE; X RAYS;

BEAM CURRENTS; GRID SHADOW METHOD; MICROBEAMS; PARASITIC FIELD CONTAMINATION; STIM;

OPTICS;

EID: 34249904110     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.01.277     Document Type: Article

References (22)

1. Watt F., and Grime G.W. Principal and Applications of High-energy Ion Microbeams (1987), Adam Hilger, Bristol
2. Johansson S.A.E., Campbell J.L., and Malmqvist K.G. Particle-Induced X-ray Emission Spectrometry (PIXE) (1995), John Wiley & Sons, NY
3. Breese M.B.H., Jamieson D.N., and King P.J.C. Materials Analysis using Nuclear Microprobe (1995), John Wiley & Sons, NY
4. Matsuyama S., Ishii K., Yamazaki H., Sakamoto R., Fujisawa M., Amartaivan Ts., Ohishi Y., Rodoriguez M., Suzuki A., Kamiya T., Oikawa M., Arakawa K., and Matsumoto N. Nucl. Instr. and Meth. B 210 (2003) 59
5. Jamieson D.N., and Legge G.J.F. Nucl. Instr. and Meth. B 29 (1987) 544
6. Matsuyama S., Ishii K., Yamazaki H., Barbotteau Y., Amartaivan Ts., Izukawa D., Hotta K., Mizuma K., Abe S., Oishi Y., Rodriguez M., Suzuki A., Sakamoto R., Fujisawa M., Kamiya T., Oikawa M., Arakawa K., Imaseki H., and Matsumoto N. Int. J. PIXE 14 1-2 (2004) 1
7. Matsuyama S., Ishii K., Abe S., Ohtsu H., Yamazaki H., Kikuchi Y., Amart aivan Ts., Inomata K., Watanabe Y., Ishizaki A., Barbotteau Y., Suzuki A., Yamaguchi T., Momose G., and Imaseki H. Int. J. PIXE 15 1-2 (2005) 41
8. Matsuyama S., Ishii K., Yamazaki H., Kikuchi Y., Amartaivan Ts., Abe S., Inomata K., Watanabe Y., Ishizaki A., Oyama R., Kawamura Y., Suzuki A., Momose G., Yamaguchi T., and Imaseki H. Int. J. PIXE 15 3-4 (2005) 257
9. Ishii K., Matsuyama S., Yamazaki H., Watanabe Y., Yamaguchi T., Momose G., Amartaivan Ts., Suzuki A., Kikuchi Y., and Galster W. Int. J. PIXE 15 3-4 (2005) 111
10. Ishii K., Matsuyama S., Yamazaki H., Watanabe Y., Kawamura Y., Yamaguchi T., Momose G., Kikuchi Y., Terakawa A., and Galster W. Nucl. Instr. and Meth. B 249 (2006) 726
11. Ishii K., Matsuyama S., Watanabe Y., Kawamura Y., Yamaguchi T., Oyama R., Momose G., Ishizaki A., Yamazaki H., and Kichuchi Y. Nucl. Instr. and Meth. A 571 (2007) 64
12. Deves G., Matsuyama S., Barbotteau Y., Ishii K., and Ortega R. Rev. Sci. Instr. 77 (2006) 056102
13. Penrice T.W. Int. J. Refract. Met. H 15 (1997) 113
14. Jamieson D.N., Zhu J., Mao Y., Lu R., Wang Z., and Zhu J. Nucl. Instr. and Meth. B 104 (1995) 86
15. Dix A., Finlay J., and Beal R. People and Computers VII. Proceedings of HCI 92 (1992), Cambridge University Press 429
16. Nielsen J. Usability Engineering (1993)
17. Matsuyama S., Ishii K., Sugimoto A., Satoh T., Gotoh K., Yamazaki H., Iwasaki S., Murozono K., Inoue J., Hamano T., Yokota S., Sakai T., Kamiya T., and Tanaka R. Int. J. PIXE 8 2-3 (1998) 203
18. Sakai T., Hamano T., Hirao T., Kamiya T., Murozono K., Inoue J., Matsuyama S., Iwasaki S., and Ishii K. Nucl. Instr. and Meth. B 136-138 (1998) 390
19. Ishii K., Sugimoto A., Tanaka A., Satoh T., Matsuyama S., Yamazaki H., Akama C., Amartaivan Ts., Endoh H., Oishi Y., Yuki H., Sugihara S., Satoh M., Kamiya T., Sakai T., Arakawa K., Saidoh M., and Oikawa S. Nucl. Instr. and Meth. B 181 (2001) 448
20. Sugimoto A., Ishii K., Matsuyama S., Satoh T., Gotoh K., Yamazaki H., and Akama C. Int. J. PIXE 9 3-4 (1999) 151
21. Tanaka A., Ishii K., Komori Y., Matsuyama S., Satoh T., Gotoh K., Yamazaki H., and Akama C. Int. J. PIXE 12 3-4 (2002) 79
22. Komori H., Mizuma K., Ishii K., Yamazaki H., Matsuyama S., Amartaivan Ts., Ohishi Y., Rodoriguez M., Suzuki A., Satoh M., Kamiya T., Sakai T., Satoh T., Oikawa M., and Arakawa K. Int. J. PIXE 124 3-4 (2004) 75