Electron screening in nanostructures

Journal of Applied Physics

Volumn 101, Issue 10, 2007, Pages

  Achoyan, A ^a   Petrosyan, S ^a   Craig, W ^b   Ruda, H E ^c   Shik, A ^c  

^a RUSSIAN ARMENIAN UNIVERSITY   (Armenia)

^b MCMASTER UNIVERSITY   (Canada)

^c UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COULOMB INTERACTIONS; NANOWIRES; SCHOTTKY BARRIER DIODES;

CONTACT CAPACITY; STRUCTURE CAPACITY; VOLTAGE DEPENDENCE;

NANOSTRUCTURED MATERIALS;

EID: 34249893351     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2734954     Document Type: Article

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