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Volumn 260, Issue 1, 2007, Pages 419-425

Proton beam writing of submicrometer structures at LIPSION

Author keywords

Electrochemical etching; Ni plating; Photo resist; Proton beam writing; Silicon

Indexed keywords

ASPECT RATIO; CURRENT DENSITY; ELECTROCHEMICAL ETCHING; ION BOMBARDMENT; NANOTECHNOLOGY; NICKEL PLATING;

EID: 34249865588     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.02.056     Document Type: Article
Times cited : (28)

References (19)
  • 14
    • 34249907084 scopus 로고    scopus 로고
    • K. Bente, G. Wagner, M. Heuer, S. Schorr, G. N. Kryukova, Th. Döring, D. Oppermann, R. Kaden. Proceedings Viennano'05 (2005).
  • 18
    • 0003412161 scopus 로고
    • Ziegler J.F. (Ed), Pergamon Press, New York
    • In: Ziegler J.F. (Ed). The Stopping and Range of Ions in Matter Vol. 2-6 (1977-1985), Pergamon Press, New York
    • (1985) The Stopping and Range of Ions in Matter , vol.2-6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.