Application of FTIR and XPS technique to the analysis of the mixture containing chromium in a low valence state

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis

Volumn 27, Issue 4, 2007, Pages 675-678

  Bai, Yu Lan ^a,b   Xu, Hong Bin ^a   Zhang, Yi ^a   Li, Zuo Hu ^a  

^a INSTITUTE OF PROCESS ENGINEERING   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Chromium compounds; Composition analysis; FTIR; Low valence state of chromium; XPS

Indexed keywords

EID: 34249853865     PISSN: 10000593     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)